"Macro-AFM model" by M. Hoelzen, D. Athavale et al.
 

Document Type

Article

Publication Date

2014

Abstract

An Atomic Force Microscope (AFM) is an important tool in modern nanoscience, capable of producing surface maps at resolutions below 1 nanometer, which is impossible for other methods. Despite AFM's often use, it is often difficult for students to understand their work because all measurement processes take place at micro- and nano-scale. The goal of this project is to create a macro scale model, which will serve as an educational tool to introduce the principles behind AFM to undergraduate and high school students. Currently, a fully automatic microprocessor-controlled surface scanning block has been built and successfully tested with a scan area of ca. one square foot. Continued work includes designing and building of a topography measurement block that will work on the same principle as a real AFM does at nano-level. We expect that macro AFM building an image using AFM techniques will empower instructors to show the concepts, and to spark interest of potential students in Bioengineering.

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