Preferential scattering by interfacial charged defects for enhanced thermoelectric performance in few-layered n-type Bi2Te3

Authors

Pooja Puneet, Clemson University
Ramakrishna Podila, Clemson University
Mehmet Karakaya, Clemson University
Song Zhu, Clemson University
Jian He, Clemson University
Terry M. Tritt, Clemson University
Mildred S. Dresselhaus, Massachusetts Institute of Technology
Apparao Rao, Clemson UniversityFollow

Document Type

Article

Publication Date

11-2013

Publication Title

Scientific Reports

Publisher

Nature Publishing Group

Abstract

Over the past two decades several nano-structuring methods have helped improve the figure of merit (ZT) in the state-of-the art bulk thermoelectric materials. While these methods could enhance the thermoelectric performance of p-type Bi₂Te₃, it was frustrating to researchers that they proved ineffective for n-type Bi₂Te₃ due to the inevitable deterioration of its thermoelectric properties in the basal plane. Here, we describe a novel chemical-exfoliation spark-plasma-sintering (CE-SPS) nano-structuring process, which transforms the microstructure of n-type Bi₂Te₃ in an extraordinary manner without compromising its basal plane properties. The CE-SPS processing leads to preferential scattering of electrons at charged grain boundaries, and thereby increases the electrical conductivity despite the presence of numerous grain boundaries, and mitigates the bipolar effect via band occupancy optimization leading to an upshift (by ~ 100 K) and stabilization of the ZT peak over a broad temperature range of ~ 150 K.

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