Date of Award
12-1972
Document Type
Dissertation
Degree Name
Doctor of Philosophy (PhD)
Legacy Department
Physics
First Advisor
Nixex D. Shenill
Second Advisor
E. P. Shillarll
Third Advisor
Farrell B. Brown
Abstract
The coupling parameter (Vs /Vp)o was measured for superconducting de transformers as a function of the separation of the two films and of the thickness of the primary film . In all experiments both the primary and secondary films were of tin, and the secondary film thickness was fixed at 200 nm . The tin films were separated by a layer of silicon monoxide. With the primary film thickness fixed at 400 nm, (Vs /Vp)o decreased from one to zero as the separation increased from 500 to 1200 nm . With the separation fixed at 30 nm, (Vs/Vp)o decreased from one to zero as the primary film thickness decreased from 75 nm to 45 nm . An experimental determination of the maximum coupling force on a fluxon in the superconducting de transformer was made by depressing (Vs /V p)o to zero by applying a current in the secondary film antiparallel to the primary film transport current . Comparison of this experimental maximum coupling force per fluxon to a theoretical maximum coupling force per fluxon for an isolated fluxon showed the experimental values to be less than the theoretical values by a factor of ten .
Recommended Citation
Lindstrom, William Alfred, "Fluxon Coupling in Superconducting DC Transformers" (1972). Archived Dissertations. 12.
https://open.clemson.edu/arv_dissertations/12