Date of Award
8-1989
Document Type
Dissertation
Degree Name
Doctor of Philosophy (PhD)
Department
Electrical Engineering
Recommended Citation
Kemp, Kevin Gerald, "The Prediction of Early Failures in Vlsi Interconnects Due to Random Subtractive Defects" (1989). Archived Dissertations. 1816.
https://open.clemson.edu/arv_dissertations/1816
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