Date of Award
5-1991
Document Type
Thesis
Degree Name
Master of Science (MS)
Department
Electrical Engineering
Recommended Citation
Heilemann, Nancy B., "The Effects of Voltage Stressing and Geometry on the Breakdown of Thin Oxides" (1991). Archived Theses. 5587.
https://open.clemson.edu/arv_theses/5587
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