Correlation Between Measured Time Dependent Dielectric Breakdown Distributions in Thin Oxides and Distributions Predicted Based on Wearout Measurements

Author

Sai K. Mopuri, Clemson University

Date of Award

12-1993

Document Type

Thesis

Degree Name

Master of Science (MS)

Department

Electrical Engineering

Recommended Citation

Mopuri, Sai K., "Correlation Between Measured Time Dependent Dielectric Breakdown Distributions in Thin Oxides and Distributions Predicted Based on Wearout Measurements" (1993). Archived Theses. 5722.
https://open.clemson.edu/arv_theses/5722