Document Type

Patent

Publication Date

5-25-2010

Patent Number

patent number 7724005

Abstract

Disclosed is an apparatus and methodology for characterization of small devices. On-chip subtraction of parasitic effects including coupling capacitive effects is provided by way of a rat-race employing a pair of gaps. A device or material being tested is positioned in a test position gap and an output signal is extracted from the rat-race at a position displaced along the rat-race between the test position gap and the other gap to provide subtractive cancellation of any parasitic effects associated with the rat-race and especially associated with the test position gap.

Application Number

12/179047

Assignees

Clemson University

Filing Date

2008-07-24

Primary/U.S. Class

324/754.28

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